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RHRPM4423K02V датащи(PDF) 25 Page - STMicroelectronics |
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RHRPM4423K02V датащи(HTML) 25 Page - STMicroelectronics |
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25 / 31 page ![]() 12.1 Other information 12.1.1 Data code The date code is structured as shown below: • EM xyywwz • QML-V yywwz where: Figure 29. Date code composition x yy ww z Assembly location (EM only) 3: Rennes (France) Week digits Last two digits of year Lot index in the week 12.1.2 Documentation Table 10. Documentation provided Quality level Documentation Engineering model - QML-V flight Certificate of conformance with group C (reliability test) and group D (package qualification) reference Precap report PIND test summary (test method conformance certificate) (1) SEM report (2) X-ray report Screening summary Failed component list, (list of components that have failed during screening) Group A summary (QCI electrical test) (3) Group B summary (QCI mechanical test) Group E (QCI wafer lot radiation test) 1. QCI = quality conformance inspection. 2. PIND = particle impact noise detection. 3. SEM = scanning electron microscope. RHRPM4423 Other information DS11827 - Rev 3 page 25/31 |
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