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ZX2 датащи(PDF) 3 Page - Omron Electronics LLC |
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ZX2 датащи(HTML) 3 Page - Omron Electronics LLC |
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3 / 15 page ![]() ZX2 3 Sensor Head 47. 47.5mm mm 47.5mm 35.5mm 22.6mm * If the room temperature varies 1°C, the measured value varies 0.02% F.S. (corresponding to 4µm for the Model ZX2-LD50) * According to OMRON investigation of CMOS laser displacement sensors performed in September 2010. Cable can be fed through from the back World smallest* Compact sensor for easy mounting IP67, robot cable & temperature characteristic 0.02% F.S./°C Reliable measurements in harsh environments Spot beam Precise measurement on micro-scale objects Line beam Stable measurement on rough-surfaced objects Regular-reflective Stable wafer measurement • Measurement range 50mm ±10mm • Resolution 1.5 µm • Linearity Line beam ±0.05%F.S.*1 Spot beam ±0.10%F.S.*1 • Beam size Line beam Approx.60µm×2.6mm Spot beam Approx.60µm dia. ZX2-LD50L Line beam type ZX2-LD50 Spot beam type • Measurement range 100mm ±35mm • Resolution 5µm • Linearity Line beam ±0.05%F.S.*2 Spot beam ±0.10%F.S.*2 • Beam size Line beam Approx.110µm×2.7mm Spot beam Approx.110µm dia. ZX2-LD100L Line beam type ZX2-LD100 Spot beam type • Measurement range 48mm ±5mm • Resolution 1. 5 µm • Linearity Spot beam ±0.3%F.S. • Beam size Spot beam Approx.60µm dia. ZX2-LD50V Spot beam type *1 Using 40 to 50mm *2 Using 65 to 100mm (regular-reflective) Sensor Heads for Various Applications-select the Range and Type of Beam New Regular-reflective Sensor Head Designed for Optimal Wafer Measurement IP67 protection class enables to use the sensor in harsh environments. A robot cable is used as standard between the head and amplifier, that the unit can be used reliably on moving parts. In addition, as 3D UV bond is used to fix the optical components rather than screws, stress can be controlled and a temperature characteristic 0.02% F.S./°C* is realized. The world’s smallest CMOS laser displacement sensor head is realized in a resin case. Enables to mount the sensor in smallest spaces and to minimize measure- ment errors arising from temperature fluctuations. |
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