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SSM6P35AFU датащи(PDF) 3 Page - Toshiba Semiconductor |
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SSM6P35AFU датащи(HTML) 3 Page - Toshiba Semiconductor |
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3 / 8 page ![]() SSM6P35AFU 3 6. Electrical Characteristics 6.1. Static Characteristics (Unless otherwise specified, Ta = 25 �)(Q1, Q2 Common) Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Drain-source breakdown voltage Gate threshold voltage Drain-source on-resistance Forward transfer admittance (Note 1) (Note 2) (Note 3) (Note 3) Symbol IGSS IDSS V(BR)DSS V(BR)DSX Vth RDS(ON) |Yfs| Test Condition VDS = 0 V, VGS = ±10 V VDS = -20 V, VGS = 0 V ID = -1 mA, VGS = 0 V ID = -1 mA, VGS = 10 V VDS = -10 V, ID = -100 µA ID = -10 mA, VGS = -1.2 V ID = -20 mA, VGS = -1.5 V ID = -50 mA, VGS = -1.8 V ID = -150 mA, VGS = -2.5 V ID = -150 mA, VGS = -4.5 V VDS = -10 V, ID = -100 mA Min � � -20 -10 -0.3 � � � � � � Typ. � � � � � 3.2 2.3 2.0 1.5 1.1 430 Max ±1 -1 � � -1 20 4.0 2.9 2.1 1.4 � Unit µA V Ω mS Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain- source breakdown voltage is lowered in this mode. Note 2: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (-100 µA for this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON). Take this into consideration when using the device. Note 3: Pulse measurement. 6.2. Dynamic Characteristics (Unless otherwise specified, Ta = 25 �)(Q1, Q2 Common) Characteristics Input capacitance Reverse transfer capacitance Output capacitance Switching time (rise time) Switching time (turn-on delay time) Switching time (fall time) Switching time (turn-off delay time) Symbol Ciss Crss Coss tr td(on) tf td(off) Test Condition VDS = -10 V, VGS = 0 V, f = 1 MHz VDD = -10 V, ID = -50 mA, VGS = 0 to -4.5 V, RG = 10 Ω Duty ≤ 1%, VIN: tr, tf < 5 ns, Common source, See Chapter 6.3. Min � � � � � � � Typ. 21 2 6 42 17 145 420 Max 42 � � � � � � Unit pF ns 6.3. Switching Time Test Circuit Fig. 6.3.1 Switching Time Test Circuit Fig. 6.3.2 Input Waveform/Output Waveform 2021-02-01 Rev.3.0 ©2017-2021 Toshiba Electronic Devices & Storage Corporation |
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