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ADAQ23876BBCZ датащи(PDF) 23 Page - Analog Devices

номер детали ADAQ23876BBCZ
подробное описание детали  16-Bit, 15 MSPS, 關Module Data Acquisition Solution
PDF  37 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
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Data Sheet
ADAQ23876
TERMINOLOGY
analog.com
Rev. 0 | 23 of 37
Integral Nonlinearity (INL)
INL is the deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs ½ LSB before the first code transition.
Positive full scale is defined as a level 1½ LSB beyond the last
code transition. The deviation is measured from the middle of each
code to the true straight line.
Differential Nonlinearity (DNL)
In an ideal µModule, code transitions are 1 LSB apart. DNL is the
maximum deviation from this ideal value. It is often specified in
terms of resolution for which no missing codes are guaranteed.
Offset Error
The first transition occurs at a level ½ LSB above analog ground
(62.5 µV for the gain = 1.38, ±2.5 V range). Offset error is the
difference between the ideal midscale input voltage (0 V) and the
actual voltage producing the midscale output code.
Offset Error Drift
Drift offset error drift is the ratio of the offset error change due to
a temperature change of 1°C and the full-scale code range (gain =
1.38, ±2.5 V range). This drift is expressed in parts per million per
degree Celsius as follows:
Offset Error Drift (ppm/°C) = 106 × (Offset Error_TMAX − Offset
Error_TMIN)/ (TMAX − TMIN)
where: TMAX = 85°C and TMIN = −40°C.
Gain Error
The first transition (from 100…000 to 1000…001) occurs at a level
½ LSB above nominal negative full scale and the last transition
(from 011…110 to 011…111) occurs for an analog voltage 1½ LSB
below the nominal positive full scale. The gain error is the deviation
of the difference between the actual level of the last transition and
the actual level of the first transition from the ideal levels after the
offset error is removed. In addition, the absolute accuracy of the
reference used for the µModule can be a large source of error.
Therefore, this error source is removed by measuring its value and
using it to determine positive full scale (PFS) and negative full scale
(NFS) for the gain error calculation. If the reference used cannot be
measured, its deviation from ideal must be factored into the gain
error calculation.
This error is expressed in percentage as follows:
Gain_Error % =100× PFS−NFSACTUAL_CODE
− PFS−NFSIDEAL_CODE/PFS−NFSIDEAL_CODE
where:
PFS is positive full scale.
NFS is negative full scale.
Gain Error Drift
Gain error drift is the ratio of the gain error change due to a
temperature change of 1°C and the full-scale range (gain = 0.37,
±10 V range). This drift is expressed in parts per million per degree
Celsius as follows:
Gain Error Drift (ppm/°C) = 106 × (Gain Error_TMAX – Gain
Error_TMIN)/(TMAX − TMIN)
where: TMAX = 85°C and TMIN = −40°C.
Spurious-Free Dynamic Range (SFDR)
SFDR is defined as the difference, in dB, between the peak spuri-
ous or harmonic component in the ADC output spectrum (up to fS/2
and excluding dc) and the rms value of the fundamental.
Effective Number of Bits (ENOB)
ENOB is a measurement of the resolution with a sine wave input.
ENOB is related to SINAD and expressed in bits as follows:
ENOB = (SINADdB − 1.76)/6.02
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of the first five harmonic compo-
nents to the rms value of a full-scale input signal and is expressed
in decibels.
Dynamic Range
Dynamic range is the ratio of the rms value of the full scale to
the total rms noise measured. The value for dynamic range is
expressed in decibels. It is measured with a signal at −60 dBFS so
that it includes all noise sources and DNL artifacts.
Signal-to-Noise Ratio (SNR)
SNR is the ratio of the rms value of the actual input signal to
the rms sum of all other spectral components below the Nyquist
frequency, excluding harmonics and dc. The value for SNR is
expressed in decibels.
Signal-to-Noise-and-Distortion (SINAD) Ratio
SINAD is the ratio of the rms value of the actual input signal to the
rms sum of all other spectral components that are less than the
Nyquist frequency, including harmonics but excluding dc. The value
of SINAD is expressed in decibels.
Aperture Delay
Aperture delay is the measure of the acquisition performance and
is the time between the rising edge of the CNV input and when the
input signal is held for a conversion.
Transient Response
Transient response is the time required for the µModule to acquire
a full-scale input step to ±1 LSB accuracy.



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