Data Sheet

ADAQ23876

16-Bit, 15 MSPS, µModule Data Acquisition Solution

Rev. 0

DOCUMENT FEEDBACK

TECHNICAL SUPPORT

Information furnished by Analog Devices is believed to be accurate and reliable "as is". However, no responsibility is assumed by Analog

Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to

change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and

registered trademarks are the property of their respective owners.

FEATURES

►

Integrated fully differential ADC driver with signal scaling

►

Wide input common-mode voltage range

►

High common-mode rejection

►

Single-ended to differential conversion

►

Pin selectable input range with overrange

►

Input ranges with 4.096 V REFBUF: ±10 V, ±5 V, ±4.096 V,

±2.5 V, and ±1.5 V

►

Gain/attenuation options: 0.37, 0.73, 0.87, 1.38, and 2.25

►

Critical passive components

►

0.005% precision matched resistor array for FDA

►

9 mm × 9 mm, 0.8 mm pitch, 100-ball CSP_BGA package

►

2.5× footprint reduction vs. discrete solution

►

Low power, dynamic power scaling, power-down mode

►

143 mW typical at 15 MSPS

►

Throughput: 15 MSPS, no pipeline delay

►

INL error: ±7.5 ppm typical, ±15 ppm maximum

►

(Gain = 0.73, gain = 0.87, gain = 1.38, gain = 2.25)

►

SINAD: 90 dB typical at 1 kHz (gain = 0.37 and gain = 0.73)

►

THD: −121 dB at 1 kHz, −112 dB at 100 kHz (gain = 0.73)

►

Gain error: ±0.005%FS typical

►

Gain error drift: ±0.11 ppm/°C typical

►

On-board reference buffer with VCMO generation

►

Serial LVDS interface

►

Wide operating temperature range: −40°C to +85°C

APPLICATIONS

►

Automatic test equipment

►

Data acquisition

►

Hardware in the Loop (HiL)

►

Power analyzers

►

Nondestructive test (acoustic emissions)

►

Mass spectrometry

►

Traveling wave fault location

►

Medical imaging and instruments

GENERAL DESCRIPTION

ition solution that reduces the development cycle of precision meas-

urement systems by transferring the design burden of component

selection, optimization, and layout from the designer to the device.

Using system-in-package (SIP) technology, the ADAQ23876 re-

duces end system component count by combining multiple common

signal processing and conditioning blocks in a single device, includ-

ing a low noise, fully differential ADC driver amplifier (FDA), a stable

reference buffer, and a high speed, 16-bit, 15 MSPS successive

approximation register (SAR) ADC.

The ADAQ23876 also incorporates the critical passive components

with superior matching and drift characteristics using Analog Devi-

error sources and to offer optimized performance. The fast settling

of the ADC driver stage and no latency of the SAR ADC provide

a unique solution for high channel count, multiplexed signal chain

architectures and control loop applications.

The small footprint, 9 mm × 9 mm, 0.8 mm pitch, 100-ball

CSP_BGA package enables smaller form factor instruments with-

out sacrificing performance. The system integration solves many

design challenges while the device still provides the flexibility of a

configurable ADC driver feedback loop to allow gain or attenuation

adjustments, as well as fully differential or single-ended to differen-

tial input. A single 5 V supply operation is possible while achieving

optimum performance from the device.

The ADAQ23876 features a serial low voltage differential signaling

(LVDS) digital interface with one-lane or two-lane output modes,

allowing the user to optimize the interface data rate for each appli-

cation. The specified operation of the ADAQ23876 is from −40°C to

+85°C.

FUNCTIONAL BLOCK DIAGRAM

Figure 1. ADAQ23876 Configured for Gain = 0.37, ±10 V Differential Input Range