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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MCIMX503CVM8B датащи(PDF) 86 Page - NXP Semiconductors |
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MCIMX503CVM8B датащи(HTML) 86 Page - NXP Semiconductors |
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86 / 136 page  i.MX50 Applications Processors for Consumer Products, Rev. 7 Electrical Characteristics Freescale Semiconductor 86 4.9.8 Secure JTAG Controller (SJC) Timing Parameters Figure 47 depicts the SJC test clock input timing. Figure 48 depicts the SJC boundary scan timing. Figure 49 depicts the SJC test access port. Figure 50 depicts the TRST timing. The signal parameters are listed in Table 64. Figure 47. Test Clock Input Timing Diagram Table 63. PWM Output Timing Parameter Ref. No. Parameter Min Max Unit 1 System CLK frequency1 1 CL of PWMO = 30 pF 0 ipg_clk MHz 2a Clock high time 12.29 — ns 2b Clock low time 9.91 — ns 3a Clock fall time — 0.5 ns 3b Clock rise time — 0.5 ns 4a Output delay time — 9.37 ns 4b Output setup time 8.71 — ns TCK (Input) VM VM VIH VIL SJ1 SJ2 SJ2 SJ3 SJ3 |
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