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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MCP6C04 датащи(PDF) 49 Page - Microchip Technology |
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MCP6C04 датащи(HTML) 49 Page - Microchip Technology |
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49 / 54 page  2019 Microchip Technology Inc. DS20006179A-page 49 MCP6C04 APPENDIX B: OFFSET TEST SCREENS Input offset voltage specifications in the DC spec table (Table 1-1) are based on bench measurements (see Section 2.1, DC Precision). These measurements are much more accurate than at test, because: • More compact circuit • Parts soldered on the PCB • More time spent averaging (reduced noise) • Better temperature control - Reduced temperature gradients - Greater accuracy We use production screens to support the quality of our VOS specification in outgoing products. The screen limits are wider and are used to eliminate fliers; see Table B-1. TABLE B-1: OFFSET TEST SCREENS Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = 2.0V to 5.5V, VSS =GND, VIP = 27.5V, VDM =0V, VREF =VDD/4, VL =VDD/2 and RL = 10 kΩ to VL; see Figure 1-9 and Figure 1-10. Parameters Sym. Min. Max. Units Gain Conditions Input Offset Voltage VOS -36 +36 μV 20 Test Screen -33 +33 50 -30 +30 100 |
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