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SWIFO111E датащи(PDF) 8 Page - Seoul Semiconductor

номер детали SWIFO111E
подробное описание детали  Direct TV Application
PDF  23 Pages
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производитель  SEOUL [Seoul Semiconductor]
домашняя страница  http://www.seoulsemicon.com
Logo SEOUL - Seoul Semiconductor

SWIFO111E датащи(HTML) 8 Page - Seoul Semiconductor

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R00 January 9, 2020
www.seoulsemicon.com
Product Data Sheet
SWIFO111E
– WICOP
8
Reliability Test
Item
Reference
Test Condition
Duration
/ Cycle
Number of
Damage
Room
Temperature
Operating Test
-
T
a = 25℃, I
F =650mA
1,000
Hours
0/20
High Temperature
Operating Test 1
-
T
a = 60℃, I
F =650mA
1,000
Hours
0/20
High Temperature
Operating Test 2
-
T
a = 85℃, I
F =650mA
1,000
Hours
0/20
Wet High
Temperature
Operating
Life(WHTOL)
-
T
a =60
o
C, RH=90%, I
F =650mA
1,000hours
0/20
ESD Test
-
2kV @ R1:10M
Ω, R2:1.5KΩ, C:100pF
3 time
0/20
Item
Symbol
Condition
Criteria for Judgment
MIN
MAX
Forward Voltage
V
F
I
F =650mA
-
I.V. *1 × 1.2
Luminous Flux
ФV
I
F =650mA
I.V. *1 × 0.7
-
Table 3. Test Items and Results
Table 4. Criteria for Judging the Damage
Notes :
*(1) I.V. : Initial Value



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