TLE4943C datasheet(42/48 Pages) INFINEON

42 / 48 page

TLE4943C

Data Sheet

V 1.2, July 2018

Electro Magnetic Compatibility

EMC Test Circuit Figure 28 is used.

Additional Information:

Characterization of Electro Magnetic Compatibility are carried out on sample base of one qualification lot. Not all

specification parameters have been monitored during EMC exposure. Only key parameters e.g. switching current

and duty cycle have been monitored.

Table 8

Ref. ISO 7637-2; 2004; (values depend on RM); dB=2mT (amplitude of sinus signal);

VDD=13.5V; fB=100Hz, T=25°C, RM=30Ω

Parameter

Symbol

Level/Typ

Status

Testpulse 1

VEMC

IV / -100V

C/ A (after stress)

Testpulse 2a1)

1) ISO 7637-2 describes internal resistance = 2

Ω (former 10 Ω)

IV / 75

A2)

2) Node A (see figure 1) does not exceed 22V clamping voltage of D2 in any case.

Testpulse 2b

- / 10V

C3)

3) Ri = 0.01

Testpulse 3a

IV / -150V

Testpulse 3b

IV / 100V

Testpulse 4

IV / -7V

Testpulse 5a

IV / 86.5V

Testpulse 5b

Us* = 28.5V4)

4) A central load dump protection of 42V is used. Us* = 42V - 13.5V

Table 9

Ref. ISO 7637-3 Release 19951); dB=2mT (amplitude of sinus signal); VDD=13.5V; fB=100Hz,

T=25°C, RM=30Ω

1) Testpulse 1 and 2 are carried out with capacitive coupling clamp even if ISO7637-3 test pulse 1 and 2 is not requesting for

capacitive coupling clamp

Parameter

Symbol

Level/Typ

Status

Testpulse 1

VEMC

IV / -30V

Testpulse 2

IV / 30V

Testpulse 3a

IV / -60V

Testpulse 3b

IV / 40V

Table 10

Ref. ISO 11452-3, 2nd edition 2001-03-01 measured in TEM-cell

Parameter

Symbol

Level/Typ

Status

ETemCell

IV / 250V/m

CW; AM=80%, f=1kHz

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