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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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PCF7936AS датащи(PDF) 30 Page - NXP Semiconductors |
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PCF7936AS датащи(HTML) 30 Page - NXP Semiconductors |
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30 / 32 page  NXP Semiconductors Product Specification Security Transponder (HITAG2) PCF7936AS 2010 May 04 30 CONFIDENTIAL 11 TEST SETUP Device characteristics are measured according to the test setups given below. Electrical characteristics are measured in a Helmholtz arrangement that generates an almost homogenous magnetic field at the position of the device under test (transponder), see Figure 29. The sense coils detect the absorption modulation induced by the transponder, whereas the reference coils sense the magnetic flux generated by the field generating coils only. The voltage difference measured between the sense coils and reference coils is proportional to the magnetic field absorption induced by the transponder. DUT FMAX Figure 28. Mechanical Stress VDIF Signal Generator ~ Reference Coils (serial connected, in phase) Reference Coils (serial connected, in phase) DUT Figure 29. Helmholtz setup for electrical characteristics |
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