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VISION2000-P датащи(PDF) 2 Page - MKS Instruments.

номер детали VISION2000-P
подробное описание детали  HIGH PERFORMANCE PROCESS MONITORING SYSTEM
PDF  4 Pages
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производитель  MKS [MKS Instruments.]
домашняя страница  https://www.mksinst.com/
Logo MKS - MKS Instruments.

VISION2000-P датащи(HTML) 2 Page - MKS Instruments.

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Description
Closed Ion Source
Each Vision 2000-P incorporates a closed ion source
and a custom inlet valve with an optimized high conduct-
ance, low surface area path to the PVD process chamber.
With this source, the system is able to monitor the
complete PVD process cycle, from base vacuum to
process pressures of up to 1e-2 mbar, without the need
for a pressure reduction inlet.
By maximizing the ratio between process gas signals
and the gas background in the differentially pumped
Vision 2000-P analyzer housing, the closed ion source
enables ppb levels of detection for trace contaminants in
the process gas. Exceptionally good residual hydrogen
detection can be achieved with the high performance
electronics.
Remote Vacuum Controller
Each Vision 2000-P system incorporates a Remote
Vacuum Controller (RVC) module that provides fail-safe
protection for both the process tool and the RGA.
Furthermore,itallowsfulloperationandcontrolofRGA
system components (filaments, pumps, inlet valves, etc.)
from the system PC. The compact, remotely mounted
rack module includes the RVC and power supplies. The
unit is easily mounted onto any standard 19” tool rack
for mounting on a process chamber or other compatible
location. 33’ (10 m) cables for ease of remotely locating
the probe assembly are included as standard.
Mobile RGA Platform
Any Vision 2000-P can be mounted on a mobile RGA
platform with the convenience of being able to move the
RGA easily between chambers as the need arises. The
mobile platform has an integrated laptop table and mounts
the electronics on the trolley. Using a standard 10 foot (3m)
cable loom the platform can be conveniently located away
from the RGA mounting point on the tool chamber.
Process EyeProfessional Control Platform
The Vision 2000-P analyzer uses Process Eye
Professional, a highly flexible, modular application
operating under 32bit or 64bit Windows XP, Vista, Server
2008 or Windows 7. Designed with a “client/server”
structure, Process Eye Professional incorporates TCP/
IP protocol for full network compatibility. Process Eye
Professional uses recipes to specify the way in which the
instrument scans, displays data, and responds to the data
acquired. Recipes are user configurable using the “Recipe
Wizard” and are ideal for monitoring repetitive processes
and analyses.
Associated bar chart spectra and recently captured spectra
are stored in a data buffer for easy review. Recipes can
be linked together for the optimum monitoring of various
phases of a particular process, or to facilitate automatic
calibration using pre-defined calibration recipes. The single
button push (or external signal) initiation of a Process Eye
Professional recipe eliminates the need for highly skilled,
full time operators.
The flexibility of Process Eye Professional allows recipes
to be configured that will:
• Definedataacquisitionanddatadisplayparameters,
along with any on-line data processing required to
convert data into relevant units and information
• Displaydatainsimultaneous“barchart”and“datatrend”
formats, allowing the comprehensive and clear
investigation of significant trend events
• Incorporatecustomwarningsandalarms,triggeredor
terminated when data highlights that process conditions
have deviated from normal conditions
• Monitoranddisplayotherparametersastrends,in
relevant units (temperature, gas flow rate, power,
pressure, etc.) which are linked into the Vision 2000-P
analyzer through its flexible analog and digital I/o
In addition, Process Eye Professional provides “live
history” for quick on-line review of data trend events.
Recently captured bar chart spectra are stored in a data
buffer and can be reviewed by moving a cursor over the
associated trend plot.
Simultaneous log bar chart/trend analysis display, illustrating wide dynamic
range scanning. Power supply potentials versus time is also shown.
Standard bar chart with log pressure axis



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