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FS9721_LP1 датащи(PDF) 31 Page - Fortune Semiconductor Corp. |
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FS9721_LP1 датащи(HTML) 31 Page - Fortune Semiconductor Corp. |
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31 / 41 page ![]() FS9721_LP1 Rev. 2.0 32/41 14.14 Resistance Measurement J6 J4 Ohm COM TENM ONEM HUNK TENK ONEK SMV SGND FS9721_LP1 AGND PTC 1k CRES1 C13 27nF R18 10k R21 100k R23 1k R24 10k R25 101.01k R27 10M R26 1.111M Rx R20 900k RL Diagram 28 Resistance Measurement Resistance measurement refers to standard resistance, and then takes a comparison between measuring resistance and standard resistance to get the measuring resistance value. The standard resistance of 40MΩ mode is 10MΩ (R27). The standard resistance of other modes are to parallel respectively R27 and R26, R25, R24, R23 to get 1MΩ, 100kΩ, 10kΩ, 1kΩ resistance. When doing resistance measurement, internal IC will generate 0.4V voltage (relative to AGND), the voltage is output respectively to measuring resistance through resistance R27 and R26, R25, R24, R23. R21 connects to RL. It is the negative end through the standard resistance to get the voltage reference. J4 and J6 are mode switch. When doing resistance measurement, J4 and J6 are close. C13 is the wave filter capacitance of measuring point in resistance measurement. 14.15 Diode Test TENM ONEK SMV DT SGND FS9721_LP1 J6 J4 VD Diode COM PTC 1k R27 10M R18 10k R19 100k R20 900k R23 1k Diagram 29 Diode Measurement Diode test is to generate 1.5V voltage from internal IC and output through R23, then add to the positive of diode through PTC. The positive voltage reduction VDgenerated by diode is about 0.5V-0.7V. VD is divided by R20 and R19, and get 1/10 VD, then is amplified 10 times by internal OP to display VD value. J4 and J6 are mode switch. When doing diode measurement, J4 and J6 are close. |
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