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AP8803 датащи(PDF) 2 Page - Diodes Incorporated

номер детали AP8803
подробное описание детали  30V 1A BUCK LED DRIVER
PDF  10 Pages
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производитель  DIODES [Diodes Incorporated]
домашняя страница  http://www.diodes.com
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AP8803 датащи(HTML) 2 Page - Diodes Incorporated

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AP8803
Document number: DS31970 Rev. 5 - 2
2 of 10
www.diodes.com
August 2012
© Diodes Incorporated
AP8803
Pin Descriptions
Pin Name
Function
SW
Switch Pin. Connect inductor/freewheeling diode here, minimizing track length at this pin to reduce EMI.
GND
GND pin
SET
Set Nominal Output Current Pin. Configure the output current of the device.
CTRL
Dimming and On/Off Control Input.
Leave floating for normal operation.
(VCTRL = VREF = 1.25V giving nominal average output current IOUTnom = 0.1/RS)
Drive to voltage below 0.2V to turn off output current
Drive with DC voltage (0.3V < VCTRL < 1.25V) to adjust output current from 25% to 100% of IOUTnom
Input voltage of 0.2V or lower forces the device into low current standby mode and shuts off the output. A PWM signal
allows the output current to be adjusted above or below the level set by the resistor connected to SET input pin.
VIN
Input Supply Pin. Must be locally decoupled to GND with > 2.2µF X7R ceramic capacitor.
Functional Block Diagram
Absolute Maximum Ratings (@TA = +25°C, unless otherwise specified.)
Symbol
Parameter
Rating
Unit
VIN
Continuous VIN pin voltage
-0.3 to +30
V
Transient (t < 0.5s)
40
VSW
SW voltage
-0.3 to +30
V
Transient (t < 0.5s)
40
VCTRL
CTRL pin input voltage
-0.3 to +6
V
ISW
Switch current
1.25
A
ESDHBM
Human Body Model ESD
500
V
ESDMM
Machine Model ESD
<100
V
TJ
Junction Temperature
150
°C
TLEAD
Lead Temperature Soldering
300
°C
TST
Storage Temperature Range
-65 to +150
°C
Caution:
Stresses greater than the 'Absolute Maximum Ratings' specified above, may cause permanent damage to the device. These are stress ratings only;
functional operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability may be
affected by exposure to absolute maximum rating conditions for extended periods of time.
Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when
handling and transporting these devices



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