HMC6832

Data Sheet

Rev. C | Page 18 of 23

TEST CIRCUITS

50Ω

50Ω

VDD = 2.5V/3.3V

HMC6832

SOURCE

GENERATOR

+

–

86Ω/150Ω

86Ω/150Ω

HIGH IMPEDANCE

PROBE

HIGH-Z

HIGH-Z

Figure 39. Test Circuit for DC LVPECL Measurements, 86 Ω Termination Used for VDD = 2.5 V; 150 Ω Termination Used for VDD = 3.3 V

50Ω

50Ω

VDD = 2.5V

HMC6832

SOURCE

GENERATOR

+

–

100Ω

HIGH IMPEDANCE

PROBE

HIGH-Z

HIGH-Z

Figure 40. Test Circuit for DC LVDS Measurements

50Ω

50Ω

VDD = 2.5V/3.3V

DC BLOCKING

CAPACITORS

HMC6832

SOURCE

GENERATOR

+

–

86Ω/150Ω

86Ω/150Ω

OSCILLOSCOPE

50Ω

50Ω

Figure 41. Test Circuit for Transient (AC) LVPECL Measurements, 86 Ω Termination Used for VDD = 2.5 V; 150 Ω Termination Used for VDD = 3.3 V

50Ω

50Ω

VDD = 2.5V

HMC6832

SOURCE

GENERATOR

+

–

OSCILLOSCOPE

50Ω

50Ω

100Ω

DC BLOCKING

CAPACITORS

Figure 42. Test Circuit for Transient (AC) LVDS Measurements

50Ω

50Ω

VDD = 2.5V

HMC6832

SSA

50Ω

150Ω

150Ω

BALUN

SATURATED

AMPLIFIER

DC BLOCKING

CAPACITORS

Figure 43. Test Circuit for Phase Noise LVPECL Measurements

50Ω

50Ω

VDD = 2.5V

HMC6832

SSA

50Ω

BALUN

SATURATED

AMPLIFIER

100Ω

DC BLOCKING

CAPACITORS

Figure 44. Test Circuit for Phase Noise LVDS Measurements