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FSUSB104 датащи(PDF) 7 Page - ON Semiconductor |
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FSUSB104 датащи(HTML) 7 Page - ON Semiconductor |
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7 / 9 page ![]() www.onsemi.com 7 Test Diagrams (Continued) Figure 9. Break-Before-Make Interval Tim ing Figure 10. Bandw idth Figure 11. Channel Off Isolation Figure 12. Non-Adjacent Channel-to-Channel Crosstalk Figure 13. Channel Off Capacitance Figure 14. Channel On Capacitance Vcc 0.9*Vout Vcc/2 t BBM 0V VOUT Input - V Sel 0.9*Vout tRISE= 2.5ns 90% 10% CL HSDn RL Dn GND GND RS VSel V SW1 GND V OUT V SW2 GND -- R L , R S , and CL are functions of the application environment (see AC Tables for specific values) C L includes test fixture and stray capacitance. V OUT GND GND R T GND GND V S R S Network Analyzer VSel GND R S and RT are functions of the application environment (see AC Tables for specific values). V IN R S and RT are functions of the application environment (see AC Tables for specific values). VOUT GND GND RT GND GND VS RS Network Analyzer RT GND VSel GND VIN RT Off isolation = 20 Log (VOUT / VIN) VOUT GND GND RT GND GND VS RS Network Analyzer RT GND R S and RT are functions of the application environment (see AC Tables for specific values). VSel GND NC VIN Crosstalk = 20 Log (VOUT / VIN) VSel = 0 or Vcc HSDn Capacitance Meter S HSDn VSel= 0 or Vcc HSDn Capacitance Meter S HSDn |
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