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FDMF3170 датащи(PDF) 3 Page - ON Semiconductor |
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FDMF3170 датащи(HTML) 3 Page - ON Semiconductor |
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3 / 21 page ![]() © 2016 Semiconductor Components Industries, LLC www.onsemi.com FDMF3170 Rev. 1.2 3 Pin Configuration VCC GL PGND GL 1 2 3 4 5 8 9 12 11 10 13 16 28 25 26 27 Top View PVCC PGND 5.0mm PGND PGND VIN VIN VIN VIN VIN AGND PGND PGND PGND PGND PGND 6 7 17 18 19 14 15 20 21 22 23 24 29 30 31 32 33 34 35 36 37 38 39 VOS 40 41 Figure 3. Pin Configuration Pin Description Pin # Name Function 1 VOS VR output voltage sensing pin for pre-OVP protection. Leave it floating if not used. 2 AGND Analog Ground for the analog portions of the IC and for substrate. 3 VCC Power Supply input for all analog control functions. 4 PVCC Power Supply input for LS Gate Driver and Boot Diode. 5, 40 PGND Reserved for PVCC de-coupling capacitor return. 6, 41 GL Low-Side Gate Monitor. 7-9, 20-24 PGND Power ground connection for Power Stage high current path. 10-19 SW Switching node junction between high-and low-side MOSFETs. 25-30 VIN Input Voltage to Power Stage. 31 NC No connect. 32 PHASE Return Connection for BOOT capacitor. 33 BOOT Supply for high-side MOSFET gate driver. A capacitor from BOOT to PHASE supplies the charge to turn on the n-channel high side MOSFET. During the freewheeling interval (LS MOSFET on) the high side capacitor is recharged by an internal diode. 34 PWM PWM input to gate driver IC. 35 EN EN=LOW disables most blocks inside IC. EN=HIGH enables all blocks inside IC and requires 4 µs power up time. 36 TMON / FLT Temperature and FAULT Reporting Pin. Pin sources a (PTAT) voltage of 0.6 V at 0°C with an 8 mV/°C slope when no module FAULT is present. In the event of a module FAULT, this pin pulls HIGH to an internal driver IC rail = 3.0 V typical. 37 N/C No connect. Some second source options require this pin to be connected. 38 IMON Current monitor output (output is referenced to REFIN) – 5 µA/A 39 REFIN Referenced voltage used for IMON feature. DC input voltage supplied by external source (not generated on SPS driver IC). |
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