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QID4520002 датащи(PDF) 3 Page - Powerex Power Semiconductors |
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QID4520002 датащи(HTML) 3 Page - Powerex Power Semiconductors |
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3 / 6 page ![]() QID4520002 Dual IGBT HVIGBT Module 200 Amperes/4500 Volts 3 Powerex, Inc., 173 Pavilion Lane,Youngwood, Pennsylvania 15697 (724) 925-7272 www.pwrx.com Preliminary 11/14 Rev. 3 Information presented is based upon manufacturers testing and projected capabilities. This information is subject to change without notice. The manufacturer makes no claim as to the suitability of use, reliability, capability, or future availability of this product. Electrical Characteristics, Tj = 25 °C unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Units Input Capacitance Cies — 29 — nF Output Capacitance Coes VGE = 0V, VCE = 10V, f = 100kHz — 1.83 — nF Reverse Transfer Capacitance Cres — 0.83 — nF Turn-on Delay Time td(on) VCC = 2800V, IC = 200A, — 1.00 — µs Rise Time tr VGE = ±15V, RG(on) = 16.2Ω, — 0.30 — µs Turn-off Delay Time td(off) RG(off) = 60Ω, LS = 150nH, — 3.6 — µs Fall Time tf Inductive Load — 0.36 — µs Turn-on Switching Energy Eon Tj = 125°C, IC = 200A, VGE = ±15V, — 917 — mJ/P Turn-off Switching Energy Eoff RG(on) = 16.2Ω, RG(off) = 60Ω, — 716 — mJ/P VCC = 2800V, LS = 150nH, Inductive Load Diode Reverse Recovery Time** trr VCC = 2800V, IE = 200A, — 0.7 — µs Diode Reverse Recovery Charge** Qrr VGE = ±15V, RG(on) = 16.2Ω, — 167* — µC Diode Reverse Recovery Energy Erec LS = 150nH, Inductive Load — 258 — mJ/P Stray Inductance (C1-E2) LSCE — 60 — nH Lead Resistance Terminal-Chip RCE — 0.8 — mΩ Thermal and Mechanical Characteristics, Tj = 25 °C unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Units Thermal Resistance, Junction to Case*** Rth(j-c) Q Per IGBT — 55 — °K/kW Thermal Resistance, Junction to Case*** Rth(j-c) D Per FWDi — 104 — °K/kW Contact Thermal Resistance, Case to Fin Rth(c-f) Per Module, — 18 — °K/kW Thermal Grease Applied, λgrease = 1W/mK Comparative Tracking Index CTI 600 — — Clearance Distance in Air (Terminal to Base) da(t-b) 35.0 — — mm Creepage Distance Along Surface ds(t-b) 64 — — mm (Terminal to Base) Clearance Distance in Air da(t-t) 19 — — mm (Terminal to Terminal) Creepage Distance Along Surface ds(t-t) 54 — — mm (Terminal to Terminal) *Pulse width and repetition rate should be such that device junction temperature rise is negligible. **Represents characteristics of the anti-parallel, emitter-to-collector free-wheel diode (FWDi). ***TC measurement point is just under the chips. |
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