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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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L9678P датащи(PDF) 121 Page - STMicroelectronics |
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L9678P датащи(HTML) 121 Page - STMicroelectronics |
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121 / 203 page  DocID029274 Rev 3 121/203 L9678P, L9678P-S Deployment drivers 202 Figure 27. Deployment timer diagnostic sequence Loop diagnostics control and results registers Diagnostic tests and channels for each test are controlled through the Loop Diagnostic Request Register (LPDIAGREQ), diagnostic results are stored in the Loop Diagnostic Status Register (LPDIAGSTAT). 6.5.2 High level diagnostic approach In this approach, the test steps described in the sections below are coded into a dedicated state machine that helps reducing the user intervention to a minimum. The high-level diagnostic commands are contained in the LPDIAGREQ, LOOP_DIAG_SEL, and LOOP_DIAG_CHSEL registers. These settings are described in the SPI Table for these commands in Read/write register. The high-level diagnostic response is available in the LPDIAGSTAT register. These are described in the SPI Table for this command in Read/write register. The concept is depicted in the following figures. |
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