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EN29F002 датащи(PDF) 22 Page - List of Unclassifed Manufacturers

номер детали EN29F002
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производитель  ETC [List of Unclassifed Manufacturers]
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EN29F002 датащи(HTML) 22 Page - List of Unclassifed Manufacturers

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4800 Great America Parkway, Suite 202
Tel: 408-235-8680
Santa Clara, CA 95054
Fax: 408-235-8685
22
EN29F002 / EN29F002N
Rev. C, Issue Date: 2001/07/05
Table 8. AC CHARACTERISTICS
Read-only Operations Characteristics
Parameter
Symbols
Speed Options
JEDEC
Standard
Description
Test Setup
-45
-55
-70
-90
Unit
tAVAV
tRC
Read Cycle Time
Min
45
55
70
90
ns
tAVQV
tACC
Address to Output Delay
CE = VIL
OE = VIL
Max
45
55
70
90
ns
tELQV
tCE
Chip Enable To Output Delay
OE = VIL
Max
45
55
70
90
ns
tGLQV
tOE
Output Enable to Output Delay
Max
25
30
30
35
ns
tEHQZ
tDF
Chip Enable to Output High Z
Max
10
15
20
20
ns
tGHQZ
tDF
Output Enable to Output High Z
Max
10
15
20
20
ns
tAXQX
tOH
Output Hold Time from
Addresses,
CE or OE ,
whichever occurs first
Min
0
0
0
0
ns
tReady
RESET Pin Low to Read
Mode (n/a for EN29F002N)
Max
20
20
20
20
µs
Notes:
For -45,-55
Vcc = 5.0V ± 5%
Output Load : 1 TTL gate and 30pF
Input Rise and Fall Times: 5ns
Input Rise Levels: 0.0 V to 3.0 V
Timing Measurement Reference Level, Input and Output: 1.5 V
For all others:
Vcc = 5.0V ± 10%
Output Load: 1 TTL gate and 100 pF
Input Rise and Fall Times: 20 ns
Input Pulse Levels: 0.45 V to 2.4 V
Timing Measurement Reference Level, Input and Output: 0.8 V and 2.0 V



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