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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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CD54HC405 датащи(PDF) 12 Page - Texas Instruments |
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CD54HC405 датащи(HTML) 12 Page - Texas Instruments |
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12 / 26 page  12 Test Circuits and Waveforms FIGURE 3. FREQUENCY RESPONSE TEST CIRCUIT FIGURE 4. CROSSTALK BETWEEN TWO SWITCHES TEST CIRCUIT FIGURE 5. SINEWAVE DISTORTION TEST CIRCUIT FIGURE 6. CONTROL TO SWITCH FEEDTHROUGH NOISE TEST CIRCUIT FIGURE 7. SWITCH OFF SIGNAL FEEDTHROUGH VIS 0.1 µF VCC 50 Ω VCC/2 10pF VOS SWITCH ON dB METER VIS 0.1 µF VCC VCC/2 C VOS1 SWITCH ON R R fIS = 1MHz SINEWAVE R = 50 Ω C = 10pF VCC R VCC/2 C SWITCH OFF R INPUT VCC/2 VOS2 dB METER VIS 10 µF VCC 10k Ω VCC/2 50pF VOS SWITCH ON DISTORTION METER SINE- WAVE VI = VIH VIS fIS = 1kHz TO 10kHz VCC 600 Ω VCC/2 50pF SWITCH ALTERNATING SCOPE VOS 600 Ω VCC/2 ON AND OFF tr, tf ≤ 6ns fCONT = 1MHz 50% DUTY CYCLE VOS VP-P E VIS 0.1 µF VCC R VCC/2 C VOS SWITCH OFF dB METER R VCC/2 VC = VIL fIS ≥ 1MHz SINEWAVE R = 50 Ω C = 10pF ’HC4051, ’HCT4051, ’HC4052, CD74HCT4052, ’HC4053, CD74HCT4053 |
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