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ABX0618M датащи(PDF) 2 Page - Advanced Semiconductor Business Inc. |
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ABX0618M датащи(HTML) 2 Page - Advanced Semiconductor Business Inc. |
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2 / 18 page ![]() 2/18 ASB Inc. sales@asb.co.kr July 2017 ABX0618M Preliminary 2. Summary on Product Performances 2.1 Typical Performance Test conditions : T = +25 C, VDD = +7 V, CW, ZO = 50 Parameters Test Conditions Min Typ Max Units Gate Bias Voltage f = 6.0 - 18.0 GHz -0.87 V Output Power at Psat1) f = 6.0 - 18.0 GHz 31 dBm Small signal gain f = 6.0 - 18.0 GHz 25 dB Input Return Loss f = 6.0 - 18.0 GHz -10 dB Output Return Loss f = 6.0 - 18.0 GHz -5 dB Supply Current VDD = +7 V 700 mA 1) Psat: Saturated output power 2.2 Product Specification Test conditions : T = +25 C, VDD= +7 V, CW, VGG = -0.87 V typical, ZO = 50 Parameter Min Typ Max Unit Frequency 6.0 18.0 GHz Small Signal Gain 25 dB Input Return Loss -10 dB Output Return Loss -5 dB Supply Current 700 mA 2.3 Absolute Maximum Ratings Parameters Max. Ratings Operating Case Temperature (Tc) -40 to 85 C Storage Temperature (Tstg) -55 to 125 C Drain Voltage (VDD) +8 V Gate Voltage (VGG) -1.5 to -0.5 V Input RF Power (Pin) 18 dBm |
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