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SSG3110 датащи(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSG3110 датащи(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 4 page ![]() Elektronische Bauelemente SSG3110 2.2A, 100V, RDS(O ) 310 mΩ Ω Ω Ω Dual- Enhancement Mode Power MOSFET 02-Sep-2016 Rev. A Page 2 of 4 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. ELECTRICAL CHARACTERISTICS (T J=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Test Condition Drain-Source Breakdown Voltage BVDSS 100 - - V VGS=0, ID=250µA Gate-Threshold Voltage VGS(th) 1 - 2.5 V VDS=VGS, ID=250µA Gate-Body Leakage Current IGSS - - ±100 nA VGS= ±20V - - 1 VDS=80V, VGS=0, TJ=25°C Zero Gate Voltage Drain Current IDSS - - 5 µA VDS=80V, VGS=0, TJ=55°C - 260 310 VGS=10V, ID=2A Drain-Source On-Resistance 2 RDS(ON) - 270 320 m VGS=4.5V, ID=1A Forward Transconductance gfs - 4 - S VDS=5V, ID=2A Input Capacitance Ciss - 508 - Output Capacitance Coss - 29 - Reverse Transfer Capacitance Crss - 16.4 - pF VDS=15V VGS=0 f=1MHz Total Gate Charge Qg - 9.1 - Gate-Source Charge Qgs - 2 - Gate-Drain Charge Qgd - 1.4 - nC VDS=50V, VGS=10V ID=2A Turn-On Delay Time Td(on) - 2 - Rise Time Tr - 21.6 - Turn-Off Delay Time Td(off) - 11.2 - Fall Time Tf - 18.8 - nS VDD=50V VGS=10V ID=2A RL=30 RG=3.3 Source-Drain Diode Diode Forward Voltage 2 VSD - - 1.2 V IS=1A, VGS=0 Continuous Source Current 1 IS - - 2.2 A Pulsed Source Current 3 ISM - - 5.5 A VD=VG=0V, Force Current Reverse Recovery Time Trr - 17.5 - nS Reverse Recovery Charge Qrr - 14 - nC IF=2A, dl/dt=100A/µs, TJ=25°C Notes: 1. Surface mounted on a 1 inch 2 FR-4 board with 2OZ copper pad. 2. Pulse Test: Pulse width≦300µs, duty cycle≦2%. 3. The power dissipation is limited by 150°C junction temperature. |
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