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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LM2485 датащи(PDF) 3 Page - National Semiconductor (TI) |
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LM2485 датащи(HTML) 3 Page - National Semiconductor (TI) |
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3 / 8 page  Test Circuits Figure 2 shows the test circuit used to evaluate the LM2485 clamp amplifier. A high impedance voltmeter (>10M Ω) is used to measure the DC voltages at the V OUT output pins. Figure 3 shows the test circuit used to evaluate the LM2485 blanking amplifier. An oscilloscope and a scope probe are used to measure the pulse amplitude at the VB OUT output pin. Typical Performance Characteristics (V CC = 220V, VBB =8V, VBIN = 0V–5V Logic Pulse at 8.6% duty cycle, Pin 12 floated, Pin 13 grounded, Test Circuits - Figure 2 and Figure 3) 20103434 FIGURE 2. Clamp Amplifier Test Circuit 20103437 FIGURE 3. Blanking Amplifier Test Circuit 20103435 FIGURE 4. V OUT vs. VIN 20103438 FIGURE 5. VB OUT (40VP-P) www.national.com 3 |
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