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LTPL-P00DMS30 датащи(PDF) 13 Page - Lite-On Technology Corporation |
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LTPL-P00DMS30 датащи(HTML) 13 Page - Lite-On Technology Corporation |
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13 / 14 page ![]() LITE-ON TECHNOLOGY CORPORATION Property of Lite-On Only Part No.: LTPL-P00DMS30 Page: 12 of 13 BNC-OD-C131/A4 Reliability Test Test Item Test Condition Test Point Number of Damaged Resistance to Soldering Heat Tsld = 260 oC, 10 sec 1 Time 0 / 22 Solderability Tsld = 245±5 oC, 3 sec 1 Time 0 / 22 Room Temperature Operating Life 25 oC, I F = 75mA/Die 1000 Hours 0 / 22 High Temperature and High Humidity Life 85 oC / 85%RH, I F = 30mA/Die 1000 Hours 0 / 22 Temperature Cycle -40 oC / 100oC, 15 min dwell, < 5 min transfer 200 Cycles 0 / 22 Thermal Shock -30 oC / 85oC, 30 min dwell, < 20 sec transfer 200 Cycles 0 / 22 High Temperature Storage Ta = 100 oC 1000 Hours 0 / 22 Low Temperature Storage Ta = -40 oC 1000 Hours 0 / 22 Criteria for Judging the Damage Criteria for Judgment Item Symbol Test Condition Min. Max. Forward Voltage Vf IF = 75mA/Die U.S.L. x 1.1 Luminous Intensity Lm IF = 75mA/Die L.S.L. x 0.7 |
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