TSX9291ILT datasheet(21/31 Pages) STMICROELECTRONICS

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DocID024568 Rev 4

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TSX9291, TSX9292

Application information

Equation 5

To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined

as a function of the maximum operating voltage and the absolute maximum rating (as

recommended by JEDEC rules).

The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at

different measurement conditions (see Equation 6).

Equation 6

The long-term drift parameter (ΔVio), estimating the reliability performance of the product, is

obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the

calculated number of months (Equation 7).

Equation 7

where Vio drift is the measured drift value in the specified test conditions after 1000 h stress

duration.

4.7

Capacitive load

Driving a large capacitive load can cause stability issues. Increasing the load capacitance

produces gain peaking in the frequency response, with overshooting and ringing in the step

response. It is usually considered that with a gain peaking higher than 2.3 dB the op-amp

might become unstable. Generally, the unity gain configuration is the worst configuration for

stability and the ability to drive large capacitive loads. Figure 39 shows the serial resistor

(Riso) that must be added to the output, to make the system stable. Figure 40 shows the

test configuration for Riso.

Months

AF 1000 h

12 months

24 h

365.25 days

()

⁄

VCC

maxVop with Vicm

VCC 2

⁄

ΔVio

Viodrift

months

()

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