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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TSV732 датащи(PDF) 18 Page - STMicroelectronics |
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TSV732 датащи(HTML) 18 Page - STMicroelectronics |
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18 / 29 page  Application information TSV731, TSV732, TSV734 18/29 DocID023708 Rev 2 Equation 5 To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined as a function of the maximum operating voltage and the absolute maximum rating (as recommended by JEDEC rules). The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at different measurement conditions (see Equation 6). Equation 6 The long term drift parameter (ΔVio), estimating the reliability performance of the product, is obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the calculated number of months (Equation 7). Equation 7 where Vio drift is the measured drift value in the specified test conditions after 1000 h stress duration. Months AF 1000 h × 12 months 24 h 365.25 days × () ⁄ × = VCC maxVop with Vicm VCC 2 ⁄ == ΔVio Viodrift months () ------------------------------ = |
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