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HT1628 датащи(PDF) 3 Page - Holtek Semiconductor Inc

номер детали HT1628
подробное описание детали  RAM Mapping 116횞2 LCD Driver
PDF  17 Pages
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производитель  HOLTEK [Holtek Semiconductor Inc]
домашняя страница  http://www.holtek.com
Logo HOLTEK - Holtek Semiconductor Inc

HT1628 датащи(HTML) 3 Page - Holtek Semiconductor Inc

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Rev. 1.00
3
December 20, 2016
HT1628
Pin Description
Pin Name
Type
Description
VDD
Positive power supply
VLCD
LCD power input
VSS
Negative power supply, ground
VCAP
O
1/2 bias voltage output pin, connected to a capacitor
CSB
I
Chip select input with pull-high resistor
1. When high, the data and commands read from or written to the device are disabled.
The serial interface circuit is also reset.
2. When low, data and command transmissions between the host controller and the
device are all enabled.
RDB
I
READ clock input with pull-high resistor
Data in the RAM of the device are clocked out on the falling edge of the RDB signal. The
clocked out data will appear on the DATA line. The host controller can use next rising
edge to latch the clocked out data.
WRB
I
WRITE clock input with pull-high resistor
Data on the DATA line are latched into the device on the rising edge of the WRB signal
DATA
I/O
Signal data input/output with pull-high resistor
DS
I
Duty select pin
DS=“1”: Static, COM0 and COM1 are output the same waveform
DS=“0”: 1/2 duty
TEST
I
Test pin with pull-high resister
Remains in a floating condition in normal mode
COM0~COM1
O
LCD Common output
SEG0~SEG115
O
LCD Segment output
Absolute Maximum Ratings
SupplyVoltage.........................VSS-0.3VtoVSS+6.5V
InputVoltage...........................VSS-0.3VtoVDD+0.3V
StorageTemperature.......................... -55°Cto150°C
OperatingTemperature........................ -40°Cto85°C
Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder“AbsoluteMaximumRatings”
maycausesubstantialdamagetothedevice.Functionaloperationofthisdeviceatotherconditionsbeyond
thoselistedinthespecificationisnotimpliedandprolongedexposuretoextremeconditionsmayaffect
devicereliability.



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