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HT7M2136 датащи(PDF) 5 Page - Holtek Semiconductor Inc |
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HT7M2136 датащи(HTML) 5 Page - Holtek Semiconductor Inc |
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5 / 25 page ![]() Rev. 1.20 5 June 17, 2016 HT7M2126/27/36/56/76 affect devices reliability. Electrical Characteristics Ta=25°C Symbol Parameter Test Conditions Min. Typ. Max. Unit VDD Conditions VDD Operating Voltage — — 2.7 3.3 5.5 V IDD1 Operating Current 3.3V Moving objects to be detected — 1.2 2.0 mA IDD2 Operating Current 3.3V Standby with detection mode, the ACC wake-up time is 4ms. — 30 50 μA TPIR PIR Stabilization Time 3.3V — — 12 — s VIL Input Low Voltage (I/O) — — 0 — 0.2VDD V VIH Input High Voltage (I/O) — — 0.8VDD — VDD V IOL I/O Port Sink Current 3.3V VOL=0.1VDD 6 12 — mA 5V 10 25 — IOH I/O Port Source Current 3.3V VOH=0.9VDD -2 -4 — mA 5V -5 -8 — RPH Pull-high Resistance (FTS) — — -5% 680 +5% kΩ VLVD Low Voltage Detector Voltage — LVDEN = 1, VLVD = 2.0V -5% 2.0 +5% V LVDEN = 1, VLVD = 2.2V 2.2 LVDEN = 1, VLVD = 2.4V 2.4 LVDEN = 1, VLVD = 2.7V 2.7 LVDEN = 1, VLVD = 3.0V 3.0 LVDEN = 1, VLVD = 3.3V 3.3 LVDEN = 1, VLVD = 3.6V 3.6 LVDEN = 1, VLVD = 4.0V 4.0 A.C. Characteristics – I2C Interface Ta=25°C Symbol Parameter Test Conditions Min. Typ. Max. Unit VDD Conditions fSCL Clock Frequency — — — — 400 kHz tBUF Bus Free Time — Time in which the bus must be free before a new transmission can start 1.3 — — μs tHD: STA Start Condition Hold Time — After this period, the first clock pulse is generated 0.6 — — μs tLOW SCL Low Time — — 1.3 — — μs tHIGH SCL High Time — — 0.6 — — μs tSU: STA Start Condition Setup Time — Time only relevant for repeated START condition 0.6 — — μs tHD: DAT Data Hold Time — — 0 — — ns tSU: DAT Data Setup Time — — 100 — — ns tR SDA and SCL Rise Time — Note — — 0.3 μs tF SDA and SCL Fall Time — Note — — 0.3 μs tSU: STO Stop Condition Set-up time — — 0.6 — — μs tAA Output Valid from Clock — — — — 0.9 μs tSP Input Filter Time Constant (SDA and SCL Pins) — Noise suppression time — — 50 ns Note: These parameters are periodically sampled but not 100% tested. |
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