STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-94680

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

E

SHEET

7

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics - Continued.

Test

Symbol

Conditions 1/ 2/ 3/

-55

unless otherwise specified

Group A

subgroups

Device

type

Limits 4/

Unit

Min

Max

Large signal voltage gain

1

01

1000

V/mV

800

2,3

500

1

02, 03

1000

M,D,P,L,R

1

02

100

M,D,P,L

1

03

100

1

02, 03

800

2,3

600

1/

Device 02 supplied to this drawing have been characterized through all levels M, D, P, L, R of irradiation.

Device 03 supplied to this drawing have been characterized through all levels P and L of irradiation.

However, device 02 is only tested at the “R” level and device type 03 is only tested at the “L” level. Pre and Post irradiation

values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for

2/

Unless otherwise specified,

3/ The 02 device may be low dose rate sensitive in a space environment and may demonstrate enhanced low dose rate

effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in

MIL-STD-883, method 1019, condition A for device type 02. Device type 03, has been tested at low dose rate.

4/

The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used

in this table. Negative current shall be defined as conventional current flow out of a device terminal.

5/

This parameter is not tested post-irradiation.

6/

7/

This test shall be 100% tested at preburn-in of interim electrical parameters and guaranteed to the limits specified in

table I herein.