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OA4MPA датащи(PDF) 18 Page - STMicroelectronics |
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OA4MPA датащи(HTML) 18 Page - STMicroelectronics |
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18 / 28 page ![]() Application information OA1MPA, OA2MPA, OA4MPA 18/28 DocID025992 Rev 1 Equation 5 To evaluate the op amp reliability, a follower stress condition is used where VCC is defined as a function of the maximum operating voltage and the absolute maximum rating (as recommended by JEDEC rules). The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at different measurement conditions (see Equation 6). Equation 6 The long term drift parameter (Vio), estimating the reliability performance of the product, is obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the calculated number of months (Equation 7). Equation 7 where Vio drift is the measured drift value in the specified test conditions after 1000 h stress duration. Months A F 1000 h 12 months 24 h 365.25 days = V CC maxV op with Vicm V CC 2 == V io V iodrift months ------------------------------ = |
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