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STM32L063C8 датащи(PDF) 116 Page - STMicroelectronics |
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STM32L063C8 датащи(HTML) 116 Page - STMicroelectronics |
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116 / 121 page ![]() Revision history STM32L063x8 116/121 DocID025660 Rev 6 9 Revision history Table 85. Document revision history Date Revision Changes 07-Feb-2014 1 Initial release. 29-Apr-2014 2 Updated Table 4: Functionalities depending on the working mode (from Run/active down to standby). Added Section 3.2: Interconnect matrix. Added VREF_OUT additional function to PB0 and PB1, updated PA0/4/5 and PC5/14 I/O structure, replaced TTa I/O structure by TC, and added note 2. in Table 15: STM32L063x8 pin definitions. Updated Table 24: General operating conditions, Table 21: Voltage characteristics and Table 22: Current characteristics. Modified conditions in Table 27: Embedded internal reference voltage. Updated Table 28: Current consumption in Run mode, code with data processing running from Flash, Table 30: Current consumption in Run mode, code with data processing running from RAM, Table 32: Current consumption in Sleep mode, Table 33: Current consumption in Low- power run mode, Table 34: Current consumption in Low-power sleep mode, Table 35: Typical and maximum current consumptions in Stop mode and Table 36: Typical and maximum current consumptions in Standby mode. Added Figure 11: IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from Flash memory, Range 2, HSE, 1WS, Figure 12: IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from Flash memory, Range 2, HSI16, 1WS, Figure 13: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS, Figure 14: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled and running on LSE Low drive and Figure 15: IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with RTC disabled, all clocks off. Updated Table 43: HSE oscillator characteristics and Table 44: LSE oscillator characteristics. Added Figure 20: HSI16 minimum and maximum value versus temperature. Updated Table 55: ESD absolute maximum ratings, Table 57: I/O current injection susceptibility and Table 58: I/O static characteristics, and added Figure 21: VIH/VIL versus VDD (CMOS I/Os) and Figure 22: VIH/VIL versus VDD (TTL I/Os). Updated Table 59: Output voltage characteristics, Table 60: I/O AC characteristics and Figure 23: I/O AC characteristics definition. Updated Table 62: ADC characteristics, Table 64: ADC accuracy, and Figure 26: Typical connection diagram using the ADC. Updated Table 67: Temperature sensor characteristics. Updated Table 73: SPI characteristics in voltage Range 1 and Table 76: I2S characteristics. Added Figure 40: Thermal resistance. |
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