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ST7262XXX датащи(PDF) 109 Page - STMicroelectronics |
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ST7262XXX датащи(HTML) 109 Page - STMicroelectronics |
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109 / 139 page ![]() 109/139 Doc ID 6996 Rev 5 EMC CHARACTERISTICS (Cont’d) 12.7.3 Absolute Maximum Ratings (Electrical Sensitivity) Based on three different tests (ESD, LU and DLU) using specific measurement methods, the product is stressed in order to determine its performance in terms of electrical sensitivity. For more details, re- fer to the application note AN1181. 12.7.3.1 Electrostatic Discharge (ESD) Electrostatic Discharges (a positive then a nega- tive pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the JESD22- A114A/A115A standard. Absolute Maximum Ratings Notes: 1. Data based on characterization results, not tested in production. 12.7.3.2 Static latchup 3 complementary static tests are required on 10 parts to assess the latchup performance. A supply overvoltage (applied to each power supply pin) and a current injection (applied to each input, out- put and configurable I/O pin) are performed on each sample. This test conforms to the EIA/JESD 78 IC latchup standard. For more details, refer to the application note AN1181. Electrical Sensitivities Notes: 1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec- ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the JEDEC criteria (international standard). Symbol Ratings Conditions Maximum value 1) Unit VESD(HBM) Electrostatic discharge voltage (Human Body Model) TA=+25°C 2000 V Symbol Parameter Conditions Class 1) LU Static latchup class TA=+25°C A Obsolete Product(s) - Obsolete Product(s) |
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