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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ST10F296 датащи(PDF) 292 Page - STMicroelectronics |
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ST10F296 датащи(HTML) 292 Page - STMicroelectronics |
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292 / 346 page  Obsolete Product(s) - Obsolete Product(s) Electrical characteristics ST10F296E 292/346 24 Electrical characteristics 24.1 Absolute maximum ratings Stresses above those listed under ‘Absolute maximum ratings’ may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this datasheet is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. During overload conditions (VIN > VDD or VIN < VSS) the voltage on pins with respect to ground (VSS) must not exceed the values defined by the absolute maximum ratings. During power-on and power-off transients (including standby entering/exiting phases), the relationship between voltages applied to the device and the main VDD must always be respected. In particular, power-on and power-off of VAREF must be coherent with the VDD transient, to avoid undesired current injection through the on-chip protection diodes. Table 159. Absolute maximum ratings Symbol Parameter Value Unit VDD Voltage on VDD pins with respect to ground (VSS) - 0.3 to +6.5 V VSTBY Voltage on VSTBY pin with respect to ground (VSS) VAREF Voltage on VAREF pin with respect to ground (VSS) - 0.3 to VDD + 0.3 VAGND Voltage on VAGND pin with respect to ground (VSS)VSS VIO Voltage on any pin with respect to ground (VSS) - 0.5 to VDD + 0.5 IOV Input current on any pin during overload condition ± 10 mA ITOV Absolute sum of all input currents during overload condition | 75 | TST Storage temperature - 65 to +150 °C ESD ESD susceptibility (human body model) 2000 V Obsolete Product(s) - Obsolete Product(s) |
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