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STM32F303VB датащи(PDF) 137 Page - STMicroelectronics |
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STM32F303VB датащи(HTML) 137 Page - STMicroelectronics |
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137 / 148 page ![]() DocID023353 Rev 13 137/148 STM32F303xB STM32F303xC Package information 141 Marking of engineering samples The following figure gives an example of topside marking orientation versus ball A1 identifier location. Figure 50. WLCSP100, 0.4 mm pitch wafer level chip scale package top view example 1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and therefore not yet ready to be used in production and any consequences deriving from such usage will not be at ST charge. In no event, ST will be liable for any customer usage of these engineering samples in production. ST Quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity. |
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