AND8090 datasheet(2/20 Pages) ONSEMI

номер детали	AND8090

подробное описание детали	AC Characteristics of ECL Devices

PDF	20 Pages

Scroll/Zoom	100%

производитель	ONSEMI [ON Semiconductor]

домашняя страница	http://www.onsemi.com

Logo

2 / 20 page

AND8090/D

http://onsemi.com

LAB TESTING

Test Bench Overview

Specialized test benches are used to determine the AC

characteristics of the Device−Under−Test (DUT). A typical

test bench setup for a differential device is shown in

Figure 1.

Test Initialization

• The test cables are connected from the pulse generator to

the appropriate DUT test board input connectors.

• The test cables are connected from the DUT test board

output connectors to the appropriate digital sampling

oscilloscope input connectors.

• The power supply cables are connected to the DUT test

board power supply connectors.

• The airflow regulator is set to 500 lfpm and the desired

DUT ambient air temperature. The DUT is in this

environment for a minimum of 3 minutes before testing

begins. Data sheet specifications are typically given for

−40

°C, 25°C, and 85°C.

CHANNEL A (50

CHANNEL B (50

TRIGGER

CHANNEL C (50

CHANNEL D (50

TRIGGER

PULSE

GENERATOR

OSCILLOSCOPE

VCC

W COAX

VEE

W COAX

Figure 1. AC Characterization Test Bench Setup

Test Board

AND8090 датащи(PDF) 2 Page - ON Semiconductor