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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TMP93CS40DF датащи(PDF) 23 Page - Toshiba Semiconductor |
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TMP93CS40DF датащи(HTML) 23 Page - Toshiba Semiconductor |
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23 / 48 page  Quality and Reliability Assurance / Handling Precautions 030901 QUA-23 2002-02-20 2.1.2 Writing an OTP type Microcontrollers-Recommended Flow In the case of blank OTP (One Time PROM) type MCU, it is not completely possible to screen defect parts that occur during assembly process, because it is not possible to perform programming test after a chip is assembled in a plastic package. As a result, it is recommended to do the following screening process to maintain quality and reliability of OTP type MCU after data are programmed. Programming and verification with an EPROM programmer. Stored in high temperature. 125°C, more than 20 hours. Data verification with an EPROM programmer Board assembly For details of the initial failure rate of OTP-type microcontrollers when screening is not performed at 125 °C for 20 hours or more after programming, please contact your Toshiba local offices. Figure 2.3 Recommended Screening flow chart of type MCU |
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