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AS28C010 датащи(PDF) 6 Page - Micross Components |
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AS28C010 датащи(HTML) 6 Page - Micross Components |
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6 / 15 page ![]() EEPROM AS28C010 AS28C010 Rev. 1.7 01/12 Micross Components reserves the right to change products or specifications without notice. 6 AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION (-55oC < T C < 125 oC; Vcc = 5V +10%) Test Conditions Input Pulse Levels: 0.0V to 3.0V Input rise and fall times: < 20ns Output Load: 1 TTL Gate +100pF (including scope and jig) Reference levels for measuring timing: 1.5V, 1.5V MIN MAX MIN MAX MIN MAX MIN MAX tRC Read Cycle Time 120 150 200 250 ns tCE Chip Enable Access Time 120 150 200 250 ns tAA Address Access Time 120 150 200 250 ns tOE Output Enable Access Time 50 50 50 50 ns tLZ (3) CE\ LOW to Active Output 0 0 0 0 ns tOLZ (3) OE\ LOW to Active Output 00 0 0 ns tHZ (3) CE\ HIGH to High Z Output 50 50 50 50 ns tOHZ (3) OE\ HIGH to High Z Output 50 50 50 50 ns tOH Output Hold from Address Change 0 0 0 0 ns Symbol UNITS Parameter -20 -15 -25 -12 AC ELECTRICAL CHARACTERISTICS FOR WRITE OPERATIONS SYMBOL PARAMETER MIN MAX UNITS tWC Write Cycle Time 10 ms tAS Address Setup Time 0ns tAH Address Hold Time 50 ns tcs Write Setup Time 0ns tCH Write Hold Time 0ns tCW CE\ Pulse Width 100 ns tOES OE\ HIGH Setup Time 10 ns tOEH OE\ HIGH Hold Time 10 ns tWP WE\ Pulse Width 100 ns tWPH WE\ HIGH Recovery 100 ns tDV Data Valid 1 s tDS Data Setup 50 ns tDH Data Hold 0ns tDW Delay to Next Write 10 s tBLC Byte Load Cycle 0.20 100 s Notes: 3) t LZ min., tOLZ min., and tOHZ are periodically sampled and not 100% tested. tHZ max. and tOHZ max. are measured, with C L=5pF, from the point when CE\ or OE\ return HIGH (whichever occurs first) to the time when the outputs are no longer driven. |
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