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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32F427AI датащи(PDF) 201 Page - STMicroelectronics |
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STM32F427AI датащи(HTML) 201 Page - STMicroelectronics |
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201 / 239 page  Package information STM32F427xx STM32F429xx 200/238 DocID024030 Rev 9 Device marking for LQFP100 The following figure gives an example of topside marking orientation versus pin 1 identifier location. Other optional marking or inset/upset marks, which depends assembly location, are not indicated below. Figure 82. LQFP100 marking example (package top view) 1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and therefore not yet ready to be used in production and any consequences deriving from such usage will not be at ST charge. In no event, ST will be liable for any customer usage of these engineering samples in production. ST Quality has to be contacted prior to any decision to use these Engineering Samples to run qualification activity. |
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