03 | Keysight | M9111A PXIe High-Speed Source/Measure Unit - Data Sheet

Stable Voltage even with Dynamic or High Capacitive

Loads

Power amplifiers and other components present a unique testing challenge: they draw

rapid pulses of current. By offering superior transient performance, the M9111A SMU

dramatically reduces the transient voltage drop due to pulsed loading and recovers

quickly to its program voltage (even with capacitances of up to 150 μF).

The M9111A provides industry-leading output stability under extreme, dynamic load

conditions so that you never have to worry about your power source interfering with

your measurements. The M9111A SMU’s glitch-free operation ensures that during

programmed output or measurement ranges changes, the M9111A’s output voltage

and current remain steady and the DUT remains unaffected. Further, to provide this

output stability, the M9111A SMU has user-selectable compensation modes that

improves usability and productivity by instantly configuring the SMU’s feedback loop

to match the impedance of the system (DUT and wiring paths).

Accurately Measure Leakage and Dynamic Currents

Measuring static current accurately can be a challenge. Measuring dynamic currents

from µA level to A is an even greater challenge. Depending on the level of current, a

different precision measurement resistor must be used, representing a measurement

range in the SMU. The three current measurement ranges (3 A, 1 mA, and 100 µA) of the

M9111A makes it tuned to quickly and accurately measure the different operating states

and power consumption of a device. The built-in measurement system enables fast

measurement of low currents down to µA, even if the DUT has a large capacitor (up to

150 µF) and the built-in high-speed digitizer measures voltage and current every

5.12 µs (~200 ksamples/s).

Triggering

The M9111A PXIe SMU utilizes the PXI chassis backplane trigger-in to receive triggers to

start a measurement.