4

AM26C31

SLLS103O – DECEMBER 1990 – REVISED JUNE 2016

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Copyright © 1990–2016, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values, except differential voltages, are with respect to the network ground terminal.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

–0.5

7

V

Input voltage

–0.5

V

Differential input voltage

–14

14

V

Output voltage

–0.5

7

Input or output clamp current

±20

mA

Output current

±150

mA

200

mA

GND current

–200

mA

Operating virtual junction temperature

150

°C

Storage temperature

–65

150

°C

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic

discharge

±2000

V

±1000

6.3 Recommended Operating Conditions

MIN

NOM

MAX

UNIT

Supply voltage

4.5

5

5.5

V

Differential input voltage

±7

V

High-level input voltage

2

V

Low-level input voltage

0.8

V

High-level output current

–20

mA

Low-level output current

20

mA

Operating free-air temperature

AM26C31C

0

70

°C

AM26C31I

–40

85

AM26C31Q

–40

125

AM26C31M

–55

125