Absolute Maximum Ratings (Note 1)

Input Voltage

6V

Input Current at any pin (Note 2)

5mA

Package Input Current (Note 2)

20mA

Package Dissipation at T

(Note 4)

900mW

Soldering Information

MSOP Package (Note 6) :

Vapor Phase (60 seconds)

215˚C

Infrared (15 seconds)

220˚C

Storage Temperature

−65˚C to + 150˚C

ESD Susceptibility (Note 5)

Human Body Model

Machine Model

2500V

250V

Operating Ratings(Note 1)

Operating Temperature

Range

T

LM88CIMM

−40˚C

≤ T

Remote Diode Junction

0˚C

≤ T

Positive Supply Voltage (V

+2.8V to +3.8V

Maximum V

and V

O_SP1

+5.5V

LM88 Electrical Characteristics

The following specifications apply for 2.8V

+

≤ 3.8V

T

Typical

LM88CIMM

Units

Symbol

Parameter

Conditions

(Note 7)

Limits

(Limits)

(Note 8)

Temperature Sensor

Setpoint Temperature Accuracy (Note 9)

+60˚C

≤ T

˚C (max)

+45˚C

≤ T

+30˚C

≤ T

Setpoint Hysteresis

1

˚C (min)

1

˚C (max)

Output Update Rate

920

ms (max)

V

I

D+SOURCE

Diode Source Current

(D+ − D−)=0.65; high

level

120

210

µA (max)

46

µA (min)

(D+ − D−)=0.65; low

level

12

21

µA (max)

4.6

µA (min)

V

D−Out

D− Output Source Voltage

0.7

V

LM88 Electrical Characteristics

The following specifications apply for 2.8V

+

≤ 3.8V

T

Symbol

Parameter

Conditions

Typical

Limits

Units

(Note 7)

(Note 8)

(Limits)

V

I

S

Supply Current

1.5

mA (max)

Digital Outputs

I

OUT(“1”)

Logical “1” Output Leakage

Current (Note 10)

V

where V

2.8V

2

µA (max)

V

2.8V

40

µA (max)

V

OUT(“0”)

Logical “0” Output Voltage

I

0.4

V (max)

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed

specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test

conditions.

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