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TLC5617CD датащи(PDF) 5 Page - Texas Instruments

номер детали TLC5617CD
подробное описание детали  PROGRAMMABLE DUAL 10-BIT DIGITAL-TO-ANALOG CONVERTERS
PDF  21 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI1 - Texas Instruments

TLC5617CD датащи(HTML) 5 Page - Texas Instruments

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TLC5617, TLC5617A
PROGRAMMABLE DUAL 10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS151B – JULY 1997 – REVISED MARCH 2000
5
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range, VDD = 5 V ± 5%,
Vref (REFIN)= 2.048 V (unless otherwise noted) (continued)
digital inputs (DIN, SCLK, CS)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IIH
High-level digital input current
VI = VDD
±1
µA
IIL
Low-level digital input current
VI = 0 V
±1
µA
Ci
Input capacitance
8
pF
power supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage, VDD
4.5
5
5.5
V
IDD
Power supply current
VDD = 5.5 V,
No load
Slow
0.6
1
mA
IDD
Power supply current
No load,
All inputs = 0 V or VDD
Fast
1.6
2.5
mA
Power down supply current
D13 = 0 (see Table 3)
1
µA
operating characteristics over recommended operating free-air temperature range, VDD = 5 V ± 5%,
Vref(REFIN) = 2.048 V (unless otherwise noted)
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SR
Output slew rate
CL = 100 pF,
RL 10 kΩ
Vref(REFIN) = 2.048 V,
TA =25°C
Slow
0.3
0.5
V/
µs
SR
Output slew rate
RL = 10 kΩ,
Code 32 to Code 1024,
TA = 25°C,
VO from 10% to 90%
Fast
2.4
3
V/
µs
t
Output settling time
To
±0.5 LSB,
CL = 100 pF,
Slow
12.5
µs
ts
Output settling time
,
RL = 10 kΩ,
See Note 10
Fast
2.5
µs
t ()
Output settling time, code
To
±0.5 LSB,
CL = 100 pF,
Slow
2
µs
ts(c)
g,
to code
,
RL = 10 kΩ,
See Note 11
Fast
2
µs
Glitch energy
DIN = All 0s to all 1s,
f(SCLK) = 100 kHz
CS = VDD,
5
nV–s
S/(N+D)
Signal to noise + distortion
Vref(REFIN) = 1 Vpp at 1 kHz and 10 kHz + 1.024 V dc,
Slow
78
dB
S/(N+D)
Signal to noise + distortion
()
Input code = 10 0000 0000
Fast
81
dB
NOTES: 10. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of 020 hex to 3FF hex or 3FF hex to 020 hex.
11. Setting time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of one count.
digital input timing requirements
MIN
NOM
MAX
UNIT
tsu(DS)
Setup time, DIN before SCLK low
5
ns
th(DH)
Hold time, DIN valid after SCLK low
5
ns
tsu(CSS)
Setup time, CS low to SCLK low
5
ns
tsu(CS1)
Setup time, SCLK
↑ to CS ↑, external end-of-write
10
ns
tsu(CS2)
Setup time, SCLK
↑ to CS ↓, start of next write cycle
5
ns
tw(CL)
Pulse duration, SCLK low
25
ns
tw(CH)
Pulse duration, SCLK high
25
ns



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