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DN2470 датащи(PDF) 3 Page - Microchip Technology |
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DN2470 датащи(HTML) 3 Page - Microchip Technology |
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3 / 11 page ![]() 2015 Microchip Technology Inc. DS20005410A-page 3 DN2470 1.0 ELECTRICAL CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS† Drain-to-source voltage................................................................................................................................................................ BVDSX Drain-to-gate voltage....................................................................................................................................................................BVDGX Gate-to-source voltage................................................................................................................................................................... ±20V Operating and storage temperature............................................................................................................................. -55°C to +150°C Note 1: All DC parameters are 100% tested at 25°C unless otherwise stated. Pulse test: 300 µs pulse, 2% duty cycle. 2: Specification is obtained by characterization and is not 100% tested. † Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. DC AND AC CHARACTERISTICS Electrical Specifications: Unless otherwise specified, for all specifications TA =TJ = +25°C Parameter Symbol Min Typ Max Units Conditions DC Parameters (Note 1, unless otherwise stated) Drain-to-source breakdown voltage BVDSX 700 – – V VGS = -5.0V, ID= 100µA Gate-to-source off voltage VGS(OFF) -1.5 – -3.5 V VDS = 25V, ID= 10µA Change in VGS(OFF) with tempera- ture ∆VGS(OFF) – – -4.5 mV/°C VDS = 25V, ID= 10µA ((Note 2) Gate body leakage current IGSS – – 100 nA VGS = ±20V, VDS= 0V Drain-to-source leakage current ID(OFF) –– 1.0 µA VDS = BVDSX, VGS = -10V –– 1.0 mA VDS = 0.8 BVDSX, VGS = -10V, TA= 125°C ((Note 2) Saturated drain-to-source current IDSS –500 - mA VGS = 0V, VDS= 25V Static drain-to-source on-state resistance RDS(ON) –– 42 Ω VGS = 0V, ID= 100mA Change in RDS(ON) with temperature ∆RDS(ON) –– 1.1 %/°C VGS= 0V, ID= 100mA (Note 2) AC Parameters (Note 2) Forward transconductance GFS 100 – – mmho VDS= 10V, ID= 100mA Input capacitance CISS – – 540 pF VGS= -10V, VDS= 25V, f = 1.0 MHz Common source output capaci- tance COSS –– 60 Reverse transfer capacitance CRSS –– 25 Turn-on delay time td(ON) –– 30 ns VDD= 25V, ID= 100mA, RGEN= 25Ω, Rise time tr –– 45 Turn-off delay time td(OFF) –– 45 Fall time tf –– 60 Diode Parameters Diode forward voltage drop VSD –– 1.8 V VGS= -5.0V, ISD= 200mA (Note 1) Reverse recovery time trr –800 – ns VGS= -5.0V, ISD= 200mA (Note 2) |
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