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DAC8564IDPWG4 датащи(PDF) 43 Page - Texas Instruments

номер детали DAC8564IDPWG4
подробное описание детали  16-Bit, Quad Channel, Ultra-Low Glitch, Voltage Output
PDF  51 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI1 - Texas Instruments

DAC8564IDPWG4 датащи(HTML) 43 Page - Texas Instruments

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DAC8564
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SBAS403D
– JUNE 2007 – REVISED MAY 2011
Signal-to-Noise plus Distortion (SINAD)
DAC Output Noise
SINAD includes all the harmonic and outstanding
DAC output noise is defined as any voltage deviation
spurious components in the definition of output noise
of DAC output from the desired value (within a
power in addition to quantizing any internal random
particular frequency band). It is measured with a DAC
noise power. SINAD is expressed in dB at a specified
channel kept at midscale while filtering the output
input frequency and sampling rate, fS.
voltage within a band of 0.1Hz to 10Hz and
measuring its amplitude peaks. It is expressed in
DAC Output Noise Density
terms of peak-to-peak voltage (Vpp).
Output
noise
density
is
defined
as
Full-Scale Range (FSR)
internally-generated random noise. Random noise is
characterized as a spectral density (nV/
√Hz). It is
Full-scale range (FSR) is the difference between the
measured by loading the DAC to midscale and
maximum and minimum analog output values that the
measuring noise at the output.
DAC is specified to provide; typically, the maximum
and minimum values are also specified. For an n-bit
DAC, these values are usually given as the values
matching with code 0 and 2n.
Copyright
© 2007–2011, Texas Instruments Incorporated
43



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