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SM3210F датащи(PDF) 21 Page - Integrated Silicon Solution, Inc |
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SM3210F датащи(HTML) 21 Page - Integrated Silicon Solution, Inc |
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21 / 33 page ![]() 21 IS42SM/RM/VM32100D Advanced Information www.issi.com - dram@issi.com Rev. 00A | Nov. 2014 Table7B: 2.5V Absolute Maximum Rating Parameter Symbol Rating Unit Ambient Temperature (Industrial) TA -40 ~ 85 C Ambient Temperature (Commercial) 0 ~ 70 Storage Temperature TSTG -55 ~ 150 C Voltage on Any Pin relative to VSS VIN, VOUT -1.0 ~ 3.6 V Voltage on VDD relative to VSS VDD, VDDQ -1.0 ~ 3.6 V Short Circuit Output Current IOS 50 mA Power Dissipation PD 1 W Note : Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Table8B: 2.5V Capacitance (TA=25 C, f=1MHz, VDD=2.5V) Parameter Pin Symbol Min Max Unit Input Capacitance CLK CI1 2 4 pF A0~A10, BA, CKE, /CS, /RAS, /CAS, /WE, DQM0~DQM3 CI2 2 4 pF Data Input/Output Capacitance DQ0~DQ31 CIO 3 5 pF Table9B: 2.5V DC Operating Condition (Voltage referenced to VSS=0V, TA= -40 ~ 85 C) Parameter Symbol Min Typ Max Unit Note Power Supply Voltage VDD 2.3 2.5 3.0 V VDDQ 2.3 2.5 3.0 V 1 Input High Voltage VIH 0.8 x VDDQ - VDDQ+0.3 V 2 Input Low Voltage VIL -0.3 0 0.3 V 3 Output High Voltage VOH 0.9 x VDDQ - - V IOH= -0.1mA Output Low Voltage VOL - - 0.2 V IOL= +0.1mA Input Leakage Current ILI -1 - 1 uA 4 Output Leakage Current ILO -1.5 1.5 uA 5 Note : 1. VDDQ must not exceed the level of VDD 2. VIH(max) = VDDQ+1.5V AC. The overshoot voltage duration is 3ns. 3. VIL(min) = -1.0V AC. The overshoot voltage duration is 3ns. 4. Any input 0V VIN VDDQ. Input leakage currents include Hi-Z output leakage for all bi-directional buffers with tri-state outputs. 5. DOUT is disabled, 0V VOUT VDDQ. |
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