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SP490E датащи(PDF) 8 Page - Sipex Corporation

номер детали SP490E
подробное описание детали  Enhanced Full Duplex RS-485 Transceivers
PDF  12 Pages
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производитель  SIPEX [Sipex Corporation]
домашняя страница  http://www.sipex.com
Logo SIPEX - Sipex Corporation

SP490E датащи(HTML) 8 Page - Sipex Corporation

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SP490EDS/14
SP490E Enhanced Full Duplex RS-485 Transceivers
© Copyright 2000 Sipex Corporation
8
There are different methods of ESD testing
applied:
a) MIL-STD-883, Method 3015.7
b) IEC1000-4-2 Air-Discharge
c) IEC1000-4-2 Direct Contact
The Human Body Model has been the generally
accepted ESD testing method for semiconductors.
This method is also specified in MIL-STD-883,
Method 3015.7 for ESD testing. The premise of
this ESD test is to simulate the human body’s
potential to store electro-static energy and
discharge it to an integrated circuit.
The
simulation is performed by using a test model as
shown in Figure 9. This method will test the IC’s
capability to withstand an ESD transient during
normal handling such as in manufacturing areas
where the ICs tend to be handled frequently.
The IEC-1000-4-2, formerly IEC801-2, is
generally used for testing ESD on equipment and
systems. For system manufacturers, they must
guarantee a certain amount of ESD protection
since the system itself is exposed to the outside
environment and human presence. The premise
with IEC1000-4-2 is that the system is required
to withstand an amount of static electricity when
ESD is applied to points and surfaces of the
R
RS
S and
and R
RV
V add up to 330
add up to 330
Ω ffor IEC1000-4-2.
or IEC1000-4-2.
RS and RV add up to 330Ω for IEC1000-4-2.
Contact-Discharge Module
Contact-Discharge Module
R
RV
V
R
RC
C
C
CS
S
R
RS
S
SW1
SW1
SW2
SW2
RC
Device
Under
Test
DC Power
Source
CS
RS
SW1
SW2
RV
Contact-Discharge Module
Figure 10. ESD Test Circuit for IEC1000-4-2
Figure 11. ESD Test Waveform for IEC1000-4-2
t=0ns
t=30ns
0A
15A
30A
t ¥
equipment that are accessible to personnel during
normal usage. The transceiver IC receives most
of the ESD current when the ESD source is
applied to the connector pins. The test circuit for
IEC1000-4-2 is shown on Figure 10. There are
two methods within IEC1000-4-2, the Air
Discharge method and the Contact Discharge
method.
With the Air Discharge Method, an ESD voltage
is applied to the equipment under test (EUT)
through air. This simulates an electrically charged



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