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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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SP3203 датащи(PDF) 12 Page - Sipex Corporation |
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SP3203 датащи(HTML) 12 Page - Sipex Corporation |
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12 / 14 page  Rev. 6/25/03 SP3203 © Copyright 2003 Sipex Corporation 12 ESD TOLERANCE The SP3203 incorporates ruggedized ESD cells on all driver output and receiver input pins. The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD-883, Method 3015.7 for ESD testing. The premise of this ESD test is to simulate the human body’s potential to store electro-static energy and Figure 18. ESD Test Circuit for Human Body Model R RC C C CSS R RSS SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 discharge it to an integrated circuit. The simulation is performed by using a test model as shown in Figure 18. This method will test the IC’s capability to withstand an ESD transient during normal handling such as in manufacturing areas where the ICs tend to be handled frequently. For the Human Body Model, the current limiting resistor (R S) and the source capacitor (CS ) are 15k Ω and 100pF, respectively. |
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