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UT54ACTS899 датащи(PDF) 6 Page - Aeroflex Circuit Technology |
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UT54ACTS899 датащи(HTML) 6 Page - Aeroflex Circuit Technology |
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6 / 17 page ![]() 6 Notes: * For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25×C per MIL-STD-883 Method 1019, Condition A up to the maximum TID level procured. 1. All specifications valid for radiation dose 1E5 rad(Si) per MIL-STD-883, Method 1019. 2. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, - 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to VIH(min) and VIL(max). 3. Not more than one output may be shorted at a time for maximum duration of one second. 4. Supplied as a design limit, but not guaranteed or tested. 5. Per MIL-PRF-38535, for current density 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765 pF-MHz. 6. Transmission driving tests are performed at VDD = 5.5V, only one output loaded at a time with a duration not to exceed 2ms. The test is guaranteed, if not tested, for VIN=VIH minimum or VIL maximum. 7. Power dissipation specified per switching output. 8. Guaranteed by characterization. 9. Power does not include power contribution of any CMOS output sink current. 10. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at frequency of 1MHz and a signal amplitude of 50mV rms maximum. Ptotal Power dissipation7, 8, 9 CL = 20pF VDD from 4.5 to 5.5 1.0 mW/ MHz IDDQ Standby Supply Current VDD Pre-Rad 25oC Pre-Rad -55oC to +125oC Post-Rad 25oC VIN = VDD or VSS VDD = 5.5 OE=VDD OE=VDD OE=VDD 10 160 A A I DDQ Quiescent Supply Current Delta, TTL in- put level Pre-Rad 25oC, Pre-Rad -55oC to +125oC Post-Rad 25oC For input under test VIN = VDD - 2.1V For other inputs VIN = VDD or VSS VDD = 5.5V 1.6 mA CIN Input capacitance 10 = 1MHz @ 0V VDD from 4.5 to 5.5 21 pF COUT Output capacitance10 = 1MHz @ 0V VDD from 4.5 to 5.5 21 pF |
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