UT54ACTS245E datasheet(5/9 Pages) AEROFLEX

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Notes:

1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, - 50%,

as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed

to VIH(min) and VIL(max).

2. Supplied as a design limit but not guaranteed or tested.

3. Per MIL-PRF-38535, for current density

 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765

pF/MHz.

4. Not more than one output may be shorted at a time for maximum duration of one second.

5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at

frequency of 1MHz and a signal amplitude of 50mV rms maximum.

6. Maximum allowable relative shift equals 50mV.

7. All specifications valid for the maximum radiation dose available for the respective device types.

8. Power does not include power contribution of any TTL output sink current.

9. Guaranteed by characterization, but not tested.

IOZH

Three-state output leakage cur-

rent, high

G = 5.5V; for all other inputs

VIN = VDD or VSS; VOUT = VDD

VDD = 5.5V

A

IOZL

Three-state output leakage cur-

rent, low

G = 5.5V; for all other inputs

VIN = VDD or VSS; VOUT = VSS

VDD = 5.5V

-30

A

Ptotal1

Power dissipation 2, 8

CL = 50pF

VDD = 4.5V to 5.5V

1.5

mW/

MHZ

Ptotal2

Power dissipation 2, 8

CL = 50pF

VDD = 3.0V to 3.6V

.75

mW/

MHZ

IDDQ

Quiescent Supply Current

VIN = VDD or VSS

VDD from 3.0V to 5.5V

A

I

DDQ

Quiescent Supply Current

Delta

For input under test

VIN = VDD -2.1V

For all other inputs

VIN = VDD or VSS

VDD = 5.5V

1.6

CIN

Input capacitance 5

 = 1MHz, V

DD = 0V

COUT

Output capacitance 5

 = 1MHz, V

DD = 0V

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