VNH7100AS datasheet(24/38 Pages) STMICROELECTRONICS

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Application information

VNH7100AS

24/38

DocID028092 Rev 4

It is preferable to switch-off VPU by using an external pull_up switch to reduce the overall

standby current during he module standby mode.

Rpull_up must be dimensioned to ensure that in normal operative conditions VOUT > VOLmax.

To satisfy this condition the Rpull_up must be selected according to:

•

if the device is used in half bridge configuration, the equation is:

•

if the device is used in H-bridge configuration, the equation is:

3.3

Immunity against transient electrical disturbances

The immunity of the device against transient electrical emissions, conducted along the

supply lines and injected into the VCC pin, is tested in accordance with ISO7637-2:2011 (E)

and ISO 16750-2:2010.

The related function performance status classification is shown in Table 14.

Test pulses are applied directly to DUT (Device Under Test) both in ON and OFF-state and

in accordance to ISO 7637-2:2011(E), chapter 4. The DUT is intended as the present device

only, without components and accessed through VCC and GND terminals.

Status II is defined in ISO 7637-1 Function Performance Status Classification (FPSC) as

follows: “The function does not perform as designed during the test but returns automatically

to normal operation after the test”.

pull_up

BATTm in

OLmax

–

L(off2)min[@VOLmax]

--------------------------------------------------------

pull_up

BATTm in

OLmax

–

L(off2)min[@VOLmax]

--------------------------------------------------------------

Table 14. ISO 7637-2 - electrical transient conduction along supply line

Test

Pulse

2011(E)

Test pulse severity

level with Status II

functional performance

status

Minimum

number of

pulses or test

time

Burst cycle / pulse

repetition time

Pulse duration and

pulse generator

internal impedance

Level

(1)

US is the peak amplitude as defined for each test pulse in ISO 7637-2:2011(E), chapter 5.6.

min

max

III

-112 V

500 pulses

0,5 s

2ms, 10

III

+55 V

500 pulses

0,2 s

5 s

50µs, 2

-220 V

90 ms

100 ms

0.1µs, 50

+150 V

90 ms

100 ms

0.1µs, 50

4(2)

-7 V

1 pulse

100ms, 0.0 1

Load dump according to ISO 16750-2:2010

Test B(3)

40 V

5 pulse

1 min

400 ms, 2

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